I have a suggestion for monitoring the metallic impurities in the pinch.
After a pinch occurs, a positively charged ion beam exits. It contains alpha particles and should also contain metallic impurities. A collection plate can be placed in the beam’s path and the metals should be deposited there. The amount of deposition is related to the vaporization from the electrodes.
The collection plates can be sent to laboratories such as: Aston Metallurgical Services Company, Inc or Silicon Cert Laboratories. They can detect the type and amount of the impurities at very small amounts. This analysis should help to speed up the performance increases in the dpf device.
